SDM1: Volume imaging, property mapping and correlative approaches

Today, many techniques allow the observation of materials from the micrometer scale to atomic resolution. Examples include electron microscopy (TEM, SEM, FIB), atomic tomography and X-ray tomography. This symposium covers all aspects of volume imaging, from the use of emerging methods, to method development for data acquisition and analysis, to applications in materials science. The symposium also covers the combination of 3D morphological and chemical imaging techniques, as well as the correlation and/or fusion of data from different volume imaging techniques.

Keywords: tomography, correlative tomography, SEM, TEM, STEM, APT, X-ray tomography.